SUCH - SUrface CHaracterisation

 
  • This technology platform has been created to gather the techniques used for characterising the surface of materials and bio-materials. 

          XPS-ESCA and ToF-SIMS+AES constitute the nucleus of this platform. 
          - X-ray photoelectron spectroscopy (XPS-ESCA
          - Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS + AES)

  • Research teams developing an expertise in these surface characterisation spectroscopies:

          Bio and Soft Matter – Surfaces (BSMA – SURF)
          which focuses on the tailoring and characterisation of organic and biological 
          surfaces

          Molecules, Solids and Reactivity (MOST)
            - Catalysis and Chemistry of divided materials
            which focuses on preparation, characterisation and optimization of inorganic solids 
            as heterogeneous catalysts
            - Chemistry of inorganic and organic materials 
            which focuses on coordination and organometallic chemistry applied to 
            heterogeneous catalysis and materials science

  • Some other surface characterisation techniques are also accessible at IMCN:

  Contact:
- Scanning Probe Microscopy (SPM's)  
       . Atomic Force Microscopy (AFM) Prof Yves Dufrêne

       . Several SPM's

Prof Bernard Nysten

- QCM-D Prof Christine Dupont

- Measurement of static and dynamic contact angles

Yasmine Adriaensen and Sylvie Derclaye

- Ellipsometry and X-ray reflectivity (XRR)

Prof Alain Jonas

- Field emission Scanning Electron Microscope LEO 982 GEMINI 

Dr Etienne Ferain

 

 

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| 27/02/2012 |
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